Last Updated： Aggregation Period:Dec 24, 2025～Jan 20, 2026
This ranking is based on the number of page views on our site.
Last Updated： Aggregation Period:Dec 24, 2025～Jan 20, 2026
This ranking is based on the number of page views on our site.
Last Updated： Aggregation Period:Dec 24, 2025～Jan 20, 2026
This ranking is based on the number of page views on our site.
1～12 item / All 12 items
Desktop X-ray diffraction device (XRD) for routine analysis in various industries.
The ARL X'TRA Companion X-ray Diffraction Device (XRD) is a cost-effective solution ideal for routine QC/QA in industrial laboratories. It is a robust and high-precision tabletop X-ray diffraction device that pursues accuracy, safety, and operability by incorporating advanced technology, making it perfect for everyday analytical tasks.
XRD is a method for obtaining information about the crystal structure of a sample from its diffraction pattern.
- Identification of crystalline substances is possible - Evaluation of crystal size (from a few nm to 100 nm) is possible - Evaluation of crystallinity is possible - Evaluation of orientation is possible - Evaluation of strain and stress is possible - Non-destructive analysis is possible Features of the equipment - Heating analysis is possible from room temperature to 1100°C - Micro-area measurement with a beam diameter of up to 100 μm is possible - Atmosphere control is possible with N2, He, Ar, and vacuum
![[Analysis Case] IGZO](https://image.mono.ipros.com/public/product/image/ac7/2000125858/IPROS8245112958528941451.jpg?w=280&h=280)
Case studies of XRD and XRR analysis of oxide semiconductors.
The transparent oxide semiconductor IGZO thin film is being researched and developed as a TFT material for displays. IGZO is a material whose properties change significantly based on the composition of the film, the presence of oxygen vacancies, and crystallinity, making it important to consider the correlation with film quality. We will introduce a case where the crystallinity, film thickness, and film density of three types of IGZO thin films with different heating temperatures were measured and compared using XRD and XRR. It was confirmed non-destructively that crystallization progresses at high temperatures, resulting in higher film density.
![[Analysis Case] Evaluation of Metal Films by High-Temperature XRD](https://image.mono.ipros.com/public/product/image/723/2000245851/IPROS3158478414424155143.jpg?w=280&h=280)
Tracking evaluation of phase transitions and crystallinity changes during the heating process.
For the sample where Pt was sputter-deposited on a Si substrate, Out-of-plane XRD and In-plane XRD measurements were conducted while increasing the temperature. In both measurements, it was observed that the peak intensity of Pt(111) increased and the full width at half maximum decreased at temperatures above 500°C, indicating that crystallization was progressing. Additionally, it was confirmed that as the temperature rose, thermal expansion caused the peaks to shift towards lower angles (the direction of increased lattice spacing).
For applications such as evaluating the particle size and strain of positive/negative electrode materials in the charge and discharge process of secondary batteries!
We would like to introduce our "Quantitative Analysis of X-ray Diffraction Data Using Rietveld Analysis." By applying Rietveld analysis to X-ray diffraction data, it is possible to quantify the mass fraction of crystalline phases, crystallite size, and uniform strain in the sample without the need for standard samples. Please feel free to contact us if you have any inquiries. 【Features】 ■ Quantification of the mass fraction of crystalline phases, crystallite size, and uniform strain in the sample without the need for standard samples. *For more details, please download the PDF or feel free to contact us.
![[Analysis Case] Measurement of Residual Stress in Metal Materials Before and After Load Application Using XRD](https://image.mono.ipros.com/public/product/image/d52/2000780189/IPROS93903369159255824822.png?w=280&h=280)
It is possible to quantitatively measure tensile and compressive stress non-destructively.
Residual stress measurement is one of the important methods to investigate whether a component can withstand various stress conditions. In XRD (X-ray diffraction), it is possible to determine residual stress by measuring the lattice spacing. This document introduces a case where a sample of aluminum plates with V-shaped processing on both sides was created for tensile testing, and a comparison of residual stress before and after applying tensile load using a tensile testing device, as well as the distribution of residual stress in the sample after application, was confirmed. The residual stress values were determined using the sin²ψ method. For more details, please download the document or contact us.
![[Analysis Case] Degradation Assessment of Cathode Active Material in Secondary Batteries](https://image.mono.ipros.com/public/product/image/318/2000839627/IPROS74098573039637606537.png?w=280&h=280)
Evaluate the degradation state of active materials from the crystal structure.
The positive electrode active material of lithium-ion secondary batteries, LiCoO2, undergoes changes in crystal interlayer spacing and other characteristics due to lithium intercalation during charge and discharge. It is also known that overcharging and long-term cycling tests can significantly alter the composition and crystal structure, leading to a decline in charge and discharge characteristics. In this presentation, we will introduce cases where these changes were evaluated using XRD and Raman spectroscopy. Furthermore, by conducting in situ (operando) XRD measurements, it is also possible to evaluate the crystal structure at various states of charge (SOC). Measurement methods: XRD, Raman, SEM Product field: Secondary batteries Analysis purposes: Composition evaluation and identification, composition distribution evaluation, shape evaluation, structural evaluation, product investigation For more details, please download the materials or contact us.
![[Analysis Case] Evaluation of Hierarchical Structure of Polymer Materials Using X-ray Diffraction and Scattering Techniques](https://image.mono.ipros.com/public/product/image/387108/IPROS15266811109041940102.png?w=280&h=280)
Structural analysis of lamellae and similar structures is possible! Similar evaluations can be performed using WAXS (Wide-Angle X-ray Scattering).
Our organization conducts evaluations of the hierarchical structure of polymer materials using X-ray diffraction and scattering techniques. It is known that the differences in higher-order structures created by amphiphilic substances affect the moisturizing and permeability properties of skin tissue, making it important to understand these structures in order to evaluate the functionality of the materials. We will introduce examples of evaluating the hierarchical structure of polymers using XRD (X-ray diffraction) for structures on the order of a few nanometers and SAXS (small-angle X-ray scattering) for structures on the order of several tens of nanometers. 【Measurement and Processing Methods】 ■ [XRD] X-ray Diffraction ■ [SAXS] Small-Angle X-ray Scattering *For more details, please download the PDF or feel free to contact us.
Ideal for quantitative analysis of environmental dust! X-ray diffraction equipment capable of measurements at high temperatures!
The "X-ray diffraction apparatus" is a device used to investigate the crystal structure, or the name of the material, by measuring the angles and intensities of the diffracted X-rays. From the diffraction positions and integrated intensities during qualitative analysis, quantitative analysis for each material can also be performed using the Rietveld refinement method. Additionally, measurements can be conducted at high temperatures (typically from room temperature to 1300 °C). 【Test Items】 ■ Identification of crystal structure and quantitative analysis ■ Measurement of lattice size and lattice strain ■ Quantitative analysis of environmental dust *For more details, please refer to the catalog or feel free to contact us.
Measurements can be taken in various environments, including under atmospheric conditions! It is also possible to measure substances buried inside.
We would like to introduce our service "Compound Identification of Hydroxyapatite Granules by XRD." There are many compounds with the same constituent elements but different properties. For example, there are many compounds referred to as calcium phosphate, one of which is hydroxyapatite (HAp), used as a medicinal component; however, elemental analysis generally cannot identify the specific compound species. X-ray diffraction (XRD) allows for the identification of compounds with the same constituent elements through crystal structure identification. 【Features】 ■ Detection of atomic periodicity ■ Identification of compounds that are difficult to distinguish by elemental analysis alone, through comparison with XRD pattern databases ■ Quantification of crystal phases is possible in cases where the Rietveld method can be applied ■ Measurement of insulators and organic materials is possible (non-destructive analysis) ■ Measurement range is from sub-mm to several cm *For more details, please download the PDF or feel free to contact us.
